The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.

Intuitive, point-and-click Windows®-based environment
Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
New pulse and pulse I-V capabilities for advanced semiconductor testing
New scope card provides integrated scope and pulse measure functionality
Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC-compliant sample tests
Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
Includes software drivers for Cascade Microtech Summit 12K Series, Karl Suss Model PA-200 and Model PA-300, Micromanipulator Model 8860, Signatone CM500 Prober, and manual probers Advanced semiconductor modeling support including Keithley supplied IC-CAP device modeling package driver and support for Cadence BSIM ProPlus/Virtuoso and Silvaco UTMOST device modeling tools

The Model 4200-CVU Integrated C-V Option is the latest addition to Keithley's growing line of optional integrated test solutions for the Model 4200 Semiconductor Characterization System. This new instrument integrates directly into one of the Model 4200's instrument slots, allowing users to integrate capacitance and conductance measurement capabilities into their already powerful parametric analyzers. With the introduction of the 4200-CVU, the Model 4200-SCS now offers semiconductor test users the flexibility to create a solution that integrates DC, pulse, and C-V testing capabilities, all in the same space-saving chassis and in one integrated test environment. The newest version of the system's software, Keithley Test Environment Interactive (KTEI, version 7.0), supports the new C-V instrument fully, allowing Model 4200-SCS users to make C-V measurements as easily as they make DC measurements. The Model 4200-CVU is supplied with the broadest C-V test and analysis library available in any commercial C-V measument solution.

C-V meter for the 4200-SCS chassis for capacitance (C) and conductance (G) measurements
C-V measurement and parameter extraction capabilities are fully integrated into the latest system software release
Extensive C-V test library and parameter extractions included
Eliminates the need for external GPIB-based C-V instrumentation
Integrated design simplifies device and materials characterization
Configure linear or custom sweeps with up to 4096 data points
Multi-frequency test signal flexibility from 10kHz to 10MHz
Available with new 4200-SCS systems or as upgrades to existing ones
Optional accessory kit for connection to popular analytical probers